DocumentCode :
3331884
Title :
Panel Statement: Increasing test coverage in a VLSI design course
Author :
Soma, Mani
Author_Institution :
Univ. of Washington
fYear :
1999
fDate :
30-30 Sept. 1999
Firstpage :
1136
Lastpage :
1136
Keywords :
Testing; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ, USA
ISSN :
1089-3539
Print_ISBN :
0-7803-5753-1
Type :
conf
DOI :
10.1109/TEST.1999.805868
Filename :
805868
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3331884