DocumentCode

3331884

Title

Panel Statement: Increasing test coverage in a VLSI design course

Author

Soma, Mani

Author_Institution

Univ. of Washington

fYear

1999

fDate

30-30 Sept. 1999

Firstpage

1136

Lastpage

1136

Keywords

Testing; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1999. Proceedings. International

Conference_Location

Atlantic City, NJ, USA

ISSN

1089-3539

Print_ISBN

0-7803-5753-1

Type

conf

DOI

10.1109/TEST.1999.805868

Filename

805868