Title :
SCITT: Back to Basics in Mass Production Testing.
Author_Institution :
Philips Research
Keywords :
Assembly systems; Circuit testing; Control systems; Integrated circuit interconnections; Mass production; SDRAM; System testing; Systems engineering and theory;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805870
