DocumentCode

3331918

Title

SCITT: Back to Basics in Mass Production Testing.

Author

De Jong, Frans

Author_Institution

Philips Research

fYear

1999

fDate

1999

Firstpage

1138

Lastpage

1138

Keywords

Assembly systems; Circuit testing; Control systems; Integrated circuit interconnections; Mass production; SDRAM; System testing; Systems engineering and theory;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1999. Proceedings. International

ISSN

1089-3539

Print_ISBN

0-7803-5753-1

Type

conf

DOI

10.1109/TEST.1999.805870

Filename

805870