• DocumentCode
    3331976
  • Title

    DFT is all I can afford, who cares about Design for Yield or Design for Reliability!

  • Author

    Wu, D.M.

  • Author_Institution
    Intel Corporation
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    1141
  • Lastpage
    1142
  • Keywords
    Contacts; Design engineering; Design for testability; Integrated circuit interconnections; Integrated circuit testing; LAN interconnection; Physics computing; Process design; Reliability engineering; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1999. Proceedings. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-5753-1
  • Type

    conf

  • DOI
    10.1109/TEST.1999.805873
  • Filename
    805873
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3331976