• DocumentCode
    3331999
  • Title

    It Makes Sense to Combine DFT and DFR/DFY

  • Author

    Aitken, Robert C.

  • Author_Institution
    Hewlett-Packard Co.
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    1143
  • Lastpage
    1143
  • Keywords
    CMOS technology; Circuit testing; Costs; Design for testability; Electrostatic discharge; Integrated circuit testing; Manufacturing processes; Process design; Stress; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1999. Proceedings. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-5753-1
  • Type

    conf

  • DOI
    10.1109/TEST.1999.805874
  • Filename
    805874
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3331999