مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3332017

Title :

DFT, DFY, DFR: Who Cares?

Author :

Fetherston, Scott

Author_Institution :

Advanced Micro Devices

fYear :

1999

fDate :

1999

Firstpage :

1144

Lastpage :

1144

Keywords :

Circuits; Consumer electronics; Design engineering; Electronics industry; Electrostatic discharge; Engineering management; Pattern matching; Protection; Radar; Testing;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Test Conference, 1999. Proceedings. International

ISSN :

1089-3539

Print_ISBN :

0-7803-5753-1

Type :

conf

DOI :

10.1109/TEST.1999.805875

Filename :

805875

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3332017