DocumentCode
3332017
Title
DFT, DFY, DFR: Who Cares?
Author
Fetherston, Scott
Author_Institution
Advanced Micro Devices
fYear
1999
fDate
1999
Firstpage
1144
Lastpage
1144
Keywords
Circuits; Consumer electronics; Design engineering; Electronics industry; Electrostatic discharge; Engineering management; Pattern matching; Protection; Radar; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1999. Proceedings. International
ISSN
1089-3539
Print_ISBN
0-7803-5753-1
Type
conf
DOI
10.1109/TEST.1999.805875
Filename
805875
Link To Document