• DocumentCode
    3332150
  • Title

    Is there a STIL for mixed signal testing?

  • Author

    Loranger, Marc

  • Author_Institution
    Credence Syst. Corp., USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    1151
  • Abstract
    Mixed signal testing is still engineering intensive, an art form, and does not lend itself to a standard approach let alone a standard. In spite of this waveform descriptions do lend themselves to a standard; consequently mixed signal STIL should limit itself to the modest goal of a standard for arbitrary domain waveform descriptions that are consistent with the digital waveforms of the current STIL
  • Keywords
    IEEE standards; automatic test pattern generation; boundary scan testing; integrated circuit testing; mixed analogue-digital integrated circuits; STIL standard; arbitrary domain waveform descriptions; digital waveform consistency; mixed signal testing; transportable test programs; Art; Circuit testing; Design engineering; Digital signal processing; Instruments; Partitioning algorithms; Signal design; Signal processing; Standardization; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1999. Proceedings. International
  • Conference_Location
    Atlantic City, NJ
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-5753-1
  • Type

    conf

  • DOI
    10.1109/TEST.1999.805882
  • Filename
    805882