DocumentCode :
3332150
Title :
Is there a STIL for mixed signal testing?
Author :
Loranger, Marc
Author_Institution :
Credence Syst. Corp., USA
fYear :
1999
fDate :
1999
Firstpage :
1151
Abstract :
Mixed signal testing is still engineering intensive, an art form, and does not lend itself to a standard approach let alone a standard. In spite of this waveform descriptions do lend themselves to a standard; consequently mixed signal STIL should limit itself to the modest goal of a standard for arbitrary domain waveform descriptions that are consistent with the digital waveforms of the current STIL
Keywords :
IEEE standards; automatic test pattern generation; boundary scan testing; integrated circuit testing; mixed analogue-digital integrated circuits; STIL standard; arbitrary domain waveform descriptions; digital waveform consistency; mixed signal testing; transportable test programs; Art; Circuit testing; Design engineering; Digital signal processing; Instruments; Partitioning algorithms; Signal design; Signal processing; Standardization; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ
ISSN :
1089-3539
Print_ISBN :
0-7803-5753-1
Type :
conf
DOI :
10.1109/TEST.1999.805882
Filename :
805882
Link To Document :
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