Title :
The research of defect detection test system based on magnetic flux leakage
Author :
Junshan Gao ; Guihong Du ; Hongling Wei
Author_Institution :
Sch. of Autom., Harbin Univ. of Sci. & Technol., Harbin, China
Abstract :
According to the defect characteristics and the failure mechanisms, the defect detection technique of rail is discussed based on the magnetic flux leakage (MFL), and a test system of magnetic flux leakage based on AT89C51 is proposed. This paper firstly introduces the theory of magnetic flux leakage, and then combining with electron and circuit theory and MCU technology we want to develop a test system of magnetic flux leakage. This test system includes the processes such as signal acquisition, preprocessing, A/D conversion, results preserving, data serial communication and real-time analysis on PC and so on. The software design of MCU is based on modularization design, which is divided into the modules of data acquisition, the modules of data preserving and the modules of data serial communication.
Keywords :
analogue-digital conversion; circuit theory; condition monitoring; data acquisition; electron theory; failure analysis; magnetic flux; magnetic leakage; mechanical engineering computing; microcontrollers; nondestructive testing; rails; signal detection; A/D conversion; MCU software design; MCU technology; circuit theory; data acquisition; data serial communication; defect detection test system; electron theory; failure mechanisms; magnetic flux leakage device; modularization design; rails; signal acquisition; Laboratories; AT89C51; magnetic flux leakage; rail; serial communication;
Conference_Titel :
Strategic Technology (IFOST), 2011 6th International Forum on
Conference_Location :
Harbin, Heilongjiang
Print_ISBN :
978-1-4577-0398-0
DOI :
10.1109/IFOST.2011.6021241