• DocumentCode
    3332264
  • Title

    Data evaluation and fitting of electron impact ionization cross sections of Ar, Cl, F, N2, O2, Cl2, F2 and their ions for plasma modeling

  • Author

    Samolov, A. ; Godunov, A.

  • Author_Institution
    Dept. of Phys., Old Dominion Univ., Norfolk, VA, USA
  • fYear
    2010
  • fDate
    20-24 June 2010
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Summary form only given. The still growing influence of the plasma technologies on the world´s largest manufacturing industries, puts new requirements on the quality of atomic data supplied. Maybe more than ever the field of plasma modeling is in need of reliable electron impact ionization cross sections data. This work aims to provide accurate analytical fits for the most common atomic species found in plasmas, such as Argon and halogen elements like Fluorine and Chlorine, etc. The first attempts for the analytical fitting of the relevant molecular species are also made. The standard BELI formula is revisited, however other analytical expressions are suggested, too, for approximating single-ionization cross sections. In the evaluation process the preference is given to experimental data up to date covering the whole range in energies. The question of the factors effecting the accuracy of the fits is addressed as well.
  • Keywords
    argon; chlorine; data analysis; electron impact ionisation; fluorine; nitrogen; oxygen; plasma collision processes; Ar; Cl; Cl2; F; F2; N2; O2; atomic species; data evaluation; data fitting; electron impact ionization cross section; molecular species; plasma modeling; single-ionization cross section; standard BELI formula; Argon; Electrons; Fitting; Impact ionization; Manufacturing industries; Physics; Plasma applications; Plasma materials processing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2010 Abstracts IEEE International Conference on
  • Conference_Location
    Norfolk, VA
  • ISSN
    0730-9244
  • Print_ISBN
    978-1-4244-5474-7
  • Electronic_ISBN
    0730-9244
  • Type

    conf

  • DOI
    10.1109/PLASMA.2010.5534169
  • Filename
    5534169