• DocumentCode
    3332374
  • Title

    OH radical generation in a discharge plasma observed by a LIF method

  • Author

    Ono, Ryo ; Oda, Tetsuji

  • Author_Institution
    Dept. of Electr. Eng., Tokyo Univ., Japan
  • Volume
    3
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    1461
  • Abstract
    Hydroxyl radicals generated by a pulsed arc discharge were measured by laser-induced fluorescence (LIF) with a tunable KrF excimer laser. Although the KrF laser had a number of excitation lines of O2 and NO, it was confirmed that the KrF laser could excite OH without interference of LIF signal from another molecule. The time evolution of OH density in the post-discharge region showed oxygen had the effect of increasing OH and shortened the O-H lifetime. That indicates O(1D) radical as well as electron reacted with H 2O to yield OH radicals and that OH reacted with products made by oxygen such as O or O3. The oxidation reaction of NO with OH was experimentally demonstrated. It was found that NO accelerated OH decay rate. The OH density was calibrated by calculating absolute density of OH
  • Keywords
    arcs (electric); excimer lasers; fluorescence; free radicals; measurement by laser beam; photoluminescence; plasma chemistry; H2O; KrF; NO; NO excitation lines; O2; O2 excitation lines; OH; OH decay rate acceleration; OH density; absolute density calculation; discharge plasma; hydroxyl radicals generation; laser-induced fluorescence; nonthermal plasma; pollutant gases decomposition; post-discharge region; pulsed arc discharge; time evolution; tunable KrF excimer laser; Arc discharges; Electrons; Fluorescence; Interference; Laser excitation; Measurement by laser beam; Optical pulse generation; Plasma measurements; Pulse measurements; Tunable circuits and devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 1999. Thirty-Fourth IAS Annual Meeting. Conference Record of the 1999 IEEE
  • Conference_Location
    Phoenix, AZ
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-5589-X
  • Type

    conf

  • DOI
    10.1109/IAS.1999.805934
  • Filename
    805934