• DocumentCode
    3332535
  • Title

    Analysis of field performance using interval-censored incident data

  • Author

    Zhao, Ke ; Steffey, Duane

  • Author_Institution
    Exponent, Inc., Menlo Park, CA
  • fYear
    2009
  • fDate
    26-29 Jan. 2009
  • Firstpage
    43
  • Lastpage
    46
  • Abstract
    Statistical time-to-failure analysis is a very powerful and versatile tool available to reliability engineers and statisticians for understanding and characterizing the failure risk and reliability of a component, device or system. Commonly applied methods of modeling time-to-failure involve fitting a parametric distribution, such as the Weibull probability function, using serial data on production or sales and incident data on units experiencing field failure since the launch of a product. When both the date of manufacture or sale and the date of incident are available from existing records, or can be easily ascertained by examination, the age of a failed unit can be determined exactly for purposes of analysis. Age censoring occurs, however, when one or both dates are missing-e.g., due to incomplete incident reporting or failure-induced physical damage to the unit. Excluding cases with incomplete date records involves a potentially significant loss of information in the time-to-failure analysis. We present several case studies to demonstrate how, in practice, such incidents can be treated as interval-censored observations in the time-to-failure analysis. Further, we evaluate the sensitivity of inferences to the inclusion of partially documented incidents to assess the value of this approach in practical applications.
  • Keywords
    Weibull distribution; failure analysis; Weibull probability function; age censoring; failure risk; failure-induced physical damage; field performance; interval censoring; statistical time-to-failure analysis; warranty claims; Data analysis; Failure analysis; Fitting; Marketing and sales; Performance analysis; Power engineering and energy; Power system modeling; Power system reliability; Reliability engineering; Risk analysis; Weibull; incomplete data; interval censoring; sales volume; time-to-failure distribution; warranty claims;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 2009. RAMS 2009. Annual
  • Conference_Location
    Fort Worth, TX
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4244-2508-2
  • Electronic_ISBN
    0149-144X
  • Type

    conf

  • DOI
    10.1109/RAMS.2009.4914647
  • Filename
    4914647