• DocumentCode
    3332568
  • Title

    Chaos evolution of short-gap discharge under dielectric-covered electrodes

  • Author

    Zheng Dian-chun ; Zhang Zhong-lin ; Zhu Shi-hua ; Zhai Xiu-quan ; Zhao Da-wei

  • Author_Institution
    Coll. of Electr. & Electron. Eng., Harbin Univ. of Sci. & Technol., Harbin, China
  • Volume
    2
  • fYear
    2011
  • fDate
    22-24 Aug. 2011
  • Firstpage
    1305
  • Lastpage
    1309
  • Abstract
    In this paper, the short gap discharge of electrode coverage was simulated numerically. The one dimensional and self-consistent fluid model of gas discharge was established which is composed by the electron and ion continuity and momentum transfer equations, and the nonlinear equations were solved by using the SG algorithm. The results showed that the short gap discharge of electrode coverage behaves the typical nonlinear characteristic such as Hopf bifurcation and Chaos. Two ways leading to Chaos have been found by changing discharge conditions, one is quasi-period and the other is double-period. Seemingly random discharge may reveal the hidden simple laws, through studying nonlinear phenomena of the short gap discharge of electrode coverage, especially the phenomena of Chaos to find out the common law, which is generally followed by complex issues.
  • Keywords
    bifurcation; chaos; discharges (electric); electrodes; nonlinear differential equations; numerical analysis; random processes; Hopf bifurcation; SG algorithm; dielectric-covered electrode; gas discharge model; ion continuity; momentum transfer equation; nonlinear equation; one dimensional fluid model; self-consistent fluid model; short-gap discharge chaos evolution; Chaos; Degradation; Insulation life; Chaos; Hopf bifurcation; Lyapunov index; electrode coverage; nonlinear; short gap discharge;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Strategic Technology (IFOST), 2011 6th International Forum on
  • Conference_Location
    Harbin, Heilongjiang
  • Print_ISBN
    978-1-4577-0398-0
  • Type

    conf

  • DOI
    10.1109/IFOST.2011.6021258
  • Filename
    6021258