DocumentCode
3332619
Title
Worst-case prediction using the Arrhenius model
Author
Yu, Yangyang ; Chen, Felix
Author_Institution
Powerwave Technol. Inc., Santa Ana, CA
fYear
2009
fDate
26-29 Jan. 2009
Firstpage
69
Lastpage
71
Abstract
We present in this paper an Arrhenius-based method of assessing MTTF as applied to one of our own products. This undertaking was motivated by a sudden mechanical change to a product nearing shipment that raised its internal operating temperature 10degC. As the time available precluded any retesting, we undertook this analysis in lieu of a full requalification to show that MTTF would not be compromised by the chassis swap. Recommendations are also given on improving the current analysis.
Keywords
prediction theory; reliability; Arrhenius model; temperature 10 degC; worst-case prediction; Acceleration; Equations; Failure analysis; Predictive models; Printed circuits; Protection; Semiconductor devices; Temperature distribution; Arrhenius model; MTTF; acceleration factor;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 2009. RAMS 2009. Annual
Conference_Location
Fort Worth, TX
ISSN
0149-144X
Print_ISBN
978-1-4244-2508-2
Electronic_ISBN
0149-144X
Type
conf
DOI
10.1109/RAMS.2009.4914652
Filename
4914652
Link To Document