• DocumentCode
    3332619
  • Title

    Worst-case prediction using the Arrhenius model

  • Author

    Yu, Yangyang ; Chen, Felix

  • Author_Institution
    Powerwave Technol. Inc., Santa Ana, CA
  • fYear
    2009
  • fDate
    26-29 Jan. 2009
  • Firstpage
    69
  • Lastpage
    71
  • Abstract
    We present in this paper an Arrhenius-based method of assessing MTTF as applied to one of our own products. This undertaking was motivated by a sudden mechanical change to a product nearing shipment that raised its internal operating temperature 10degC. As the time available precluded any retesting, we undertook this analysis in lieu of a full requalification to show that MTTF would not be compromised by the chassis swap. Recommendations are also given on improving the current analysis.
  • Keywords
    prediction theory; reliability; Arrhenius model; temperature 10 degC; worst-case prediction; Acceleration; Equations; Failure analysis; Predictive models; Printed circuits; Protection; Semiconductor devices; Temperature distribution; Arrhenius model; MTTF; acceleration factor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 2009. RAMS 2009. Annual
  • Conference_Location
    Fort Worth, TX
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4244-2508-2
  • Electronic_ISBN
    0149-144X
  • Type

    conf

  • DOI
    10.1109/RAMS.2009.4914652
  • Filename
    4914652