• DocumentCode
    3332677
  • Title

    Product robust design via accelerated degradation tests

  • Author

    Sanchez, Luis Mejia ; Pan, Rong

  • Author_Institution
    Arizona State Univ., AZ
  • fYear
    2009
  • fDate
    26-29 Jan. 2009
  • Firstpage
    89
  • Lastpage
    94
  • Abstract
    Accelerated degradation tests (ADTs) are often applied for assessing the reliability of highly reliable products, but it is realized that ADT experiment can also be used as a tool for improving product design. In particular, when external stress factors are not constants in a product-s use environment, it is necessary to utilize ADT experiments to investigate the interaction between these stress factors and product design factors so that a robust design, which is insensitive to external stress factors, can be obtained. In this paper, a methodology is developed for achieving product robust design via ADTs. We present a degradation model that can be used for studying the effects of design and stress factors on degradation rate. Model parameter estimation is obtained by the maximum likelihood method and an optimization procedure is derived for finding the best setting of design factors that can minimize the effect of stress variation. Finally, the proposed method is validated by a case study of window wiper switch experiment.
  • Keywords
    life testing; reliability; accelerated degradation tests; external stress factors; maximum likelihood method; parameter estimation; product robust design; Degradation; Design optimization; Life estimation; Maximum likelihood estimation; Parameter estimation; Product design; Robustness; Stress; Switches; Testing; Degradation Model; Reliability Improvement; Response Surface Methodology; Robust Parameter Design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 2009. RAMS 2009. Annual
  • Conference_Location
    Fort Worth, TX
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4244-2508-2
  • Electronic_ISBN
    0149-144X
  • Type

    conf

  • DOI
    10.1109/RAMS.2009.4914656
  • Filename
    4914656