DocumentCode
3332702
Title
Behavioral-Level Test Development
Author
Johnson, William A.
Author_Institution
Texas Instruments Incorporated, Dallas, TX
fYear
1979
fDate
25-27 June 1979
Firstpage
171
Lastpage
179
Abstract
An argument is made that the economics of test development in the LSI-VLSI era require creation and use of test development software aids that operate from high-level behavioral circuit models. Behavioral models are defined to be abstract specifications of the circuit function. Problems with the use of current-day gate-level software aids are discussed. Suggestions are given for implementing behavioral-level test generation tools. Recent work in this area at Texas Instruments Incorporated (TI) is discussed.
Keywords
Automatic logic units; Circuit faults; Circuit testing; Costs; Environmental economics; Instruments; Integrated circuit modeling; Logic circuits; Logic testing; Software testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1979. 16th Conference on
Type
conf
DOI
10.1109/DAC.1979.1600105
Filename
1600105
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