Title :
Generation of Hazard Free Tests Using the D-Algorithm in a Timing Accurate System for Logic and Deductive Fault Simulation
Author :
Kjelkerud, Eskil ; Thessen, Owe
Author_Institution :
Royal Institute of Technology, STOCKHOLM, Sweden
Abstract :
It is described how a timing accurate system for logic and deductive fault simulation can be used in the forward tracing part of the D-algorithm. The logic simulation is used for the forward implication and the verification phases. The deductive fault simulator is used for D-propagation. Some results from executions of the test generation program are presented.
Keywords :
Algorithms; Circuit faults; Circuit simulation; Computational modeling; Computer simulation; Hazards; Logic testing; Sequential analysis; System testing; Timing;
Conference_Titel :
Design Automation, 1979. 16th Conference on
DOI :
10.1109/DAC.1979.1600106
