• DocumentCode
    3333170
  • Title

    3rd generation of 1200 V IGBT modules

  • Author

    Hierholzer, M. ; Laska, Th. ; Loddenkotter, M. ; Münzer, M. ; Pfirsch, F. ; Schaffer, Chris ; Schmidt, Th.

  • Author_Institution
    eupec GmbH & Co. KG, Warstein, Germany
  • Volume
    3
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    1787
  • Abstract
    IGBT-modules are the most frequently used semiconductors for power applications. The markets demand for higher power integration in one module is limited by the chip losses and the housings capability to dissipate this power. With the 3rd generation of 1200 V IGBT modules eupec presents a product line with up to 50% higher current density in the same housing. In addition to familiar housings a new standard, the EconoPACK+, is introduced. So far the manufacturers had to deal with a three dimensional trade off between ruggedness, switching losses and saturation losses. Combining two technologies Infineon Technologies (formerly Siemens Semiconductors (HL)) in cooperation with eupec Warstein has designed the IGBT3 that incorporates the ruggedness of a chip with a planar cell design with the low saturation of a trench IGBT. A vertically optimized device structure lowers the saturation voltage again and what is more important, also reduces the dynamic losses. In connection with eupec´s advanced packaging technology this leads to a higher power integration without a rise of system costs due to additional protection circuits. The performance of 3rd generation IGBT modules is discussed and a new product range introduced
  • Keywords
    insulated gate bipolar transistors; losses; power semiconductor switches; semiconductor device packaging; 1200 V; EconoPACK+; IGBT modules; IGBT3; Infineon Technologies; advanced packaging technology; chip losses; current density; dynamic losses reduction; eupec; eupec Warstein; low saturation; planar cell design; power applications; power dissipation; ruggedness; saturation losses; saturation voltage reduction; switching losses; trench IGBT; vertically optimized device structure; Buffer layers; Costs; Current density; Insulated gate bipolar transistors; Packaging; Power semiconductor switches; Power system protection; Semiconductor device manufacture; Switching loss; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 1999. Thirty-Fourth IAS Annual Meeting. Conference Record of the 1999 IEEE
  • Conference_Location
    Phoenix, AZ
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-5589-X
  • Type

    conf

  • DOI
    10.1109/IAS.1999.805982
  • Filename
    805982