Title :
Enhancement of MCM testability using an embedded reconfigurable FPGA
Author :
York, John ; Powell, Tim ; Dehkordi, Peyman ; Bouldin, Don
Author_Institution :
Dept. of Electr. Eng., Tennessee Univ., Knoxville, TN, USA
Abstract :
The testability of an MCM can be enhanced significantly for very little cost whenever a reprogrammable FPGA component that is already embedded in the MCM for functionality is utilized for diagnostics. This approach can have some of the characteristics of a smart substrate which uses the scan cell beside-the-signal-path (BSP) methodology. The design and implementation of an MCM with this capability is presented along with descriptions of the self-test algorithms, fault isolation and real-time testing and monitoring that this method provides
Keywords :
built-in self test; field programmable gate arrays; integrated circuit testing; multichip modules; real-time systems; reconfigurable architectures; BSP smart substrate; MCM testability; embedded reconfigurable FPGA; fault isolation; monitoring; real-time testing; scan cell beside-the-signal-path methodology; self-test algorithm; Algorithm design and analysis; Circuit testing; Cost function; Design methodology; Electronic mail; Field programmable gate arrays; Integrated circuit interconnections; Integrated circuit testing; Probes; System testing;
Conference_Titel :
Innovative Systems in Silicon, 1997. Proceedings., Second Annual IEEE International Conference on
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-4276-3
DOI :
10.1109/ICISS.1997.630257
