• DocumentCode
    3333286
  • Title

    A statistical approach to noise response measurements in thin Al-Cu 1.9% films

  • Author

    Dreyer, M.L. ; Cottle, J.G.

  • Author_Institution
    Dept. of Electr. Eng., South Florida Univ., Tampa, FL, USA
  • fYear
    1989
  • fDate
    9-12 Apr 1989
  • Firstpage
    1301
  • Abstract
    The authors present a statistically designed experiment to test a previously proposed 1/f2 noise generation model (see T.M Chen and J.G Cottle, 1988). The experiment is designed to provide data on a possible current-density-dependent noise activation energy as well as to test the validity of the model over a wide range of measurement parameters of Al-Cu(1.9%) films. The proposed experiment is based on a single-measurement-per-film methodology. This approach assures that the data are not corrupted by errors associated with multiple measurements on the same thin film. Preliminary results indicate the need to transform the noise data before statistical analysis may be performed
  • Keywords
    aluminium alloys; copper alloys; metallic thin films; metallisation; random noise; statistical analysis; 1/f2 noise generation model; Al-Cu thin films; current-density-dependent noise activation energy; noise response; single-measurement-per-film methodology; statistical analysis; statistical approach; Cows; Current density; Density measurement; Frequency; Large Hadron Collider; Noise measurement; Temperature; Tiles; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Southeastcon '89. Proceedings. Energy and Information Technologies in the Southeast., IEEE
  • Conference_Location
    Columbia, SC
  • Type

    conf

  • DOI
    10.1109/SECON.1989.132632
  • Filename
    132632