DocumentCode
3333286
Title
A statistical approach to noise response measurements in thin Al-Cu 1.9% films
Author
Dreyer, M.L. ; Cottle, J.G.
Author_Institution
Dept. of Electr. Eng., South Florida Univ., Tampa, FL, USA
fYear
1989
fDate
9-12 Apr 1989
Firstpage
1301
Abstract
The authors present a statistically designed experiment to test a previously proposed 1/f 2 noise generation model (see T.M Chen and J.G Cottle, 1988). The experiment is designed to provide data on a possible current-density-dependent noise activation energy as well as to test the validity of the model over a wide range of measurement parameters of Al-Cu(1.9%) films. The proposed experiment is based on a single-measurement-per-film methodology. This approach assures that the data are not corrupted by errors associated with multiple measurements on the same thin film. Preliminary results indicate the need to transform the noise data before statistical analysis may be performed
Keywords
aluminium alloys; copper alloys; metallic thin films; metallisation; random noise; statistical analysis; 1/f2 noise generation model; Al-Cu thin films; current-density-dependent noise activation energy; noise response; single-measurement-per-film methodology; statistical analysis; statistical approach; Cows; Current density; Density measurement; Frequency; Large Hadron Collider; Noise measurement; Temperature; Tiles; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Southeastcon '89. Proceedings. Energy and Information Technologies in the Southeast., IEEE
Conference_Location
Columbia, SC
Type
conf
DOI
10.1109/SECON.1989.132632
Filename
132632
Link To Document