DocumentCode :
3333286
Title :
A statistical approach to noise response measurements in thin Al-Cu 1.9% films
Author :
Dreyer, M.L. ; Cottle, J.G.
Author_Institution :
Dept. of Electr. Eng., South Florida Univ., Tampa, FL, USA
fYear :
1989
fDate :
9-12 Apr 1989
Firstpage :
1301
Abstract :
The authors present a statistically designed experiment to test a previously proposed 1/f2 noise generation model (see T.M Chen and J.G Cottle, 1988). The experiment is designed to provide data on a possible current-density-dependent noise activation energy as well as to test the validity of the model over a wide range of measurement parameters of Al-Cu(1.9%) films. The proposed experiment is based on a single-measurement-per-film methodology. This approach assures that the data are not corrupted by errors associated with multiple measurements on the same thin film. Preliminary results indicate the need to transform the noise data before statistical analysis may be performed
Keywords :
aluminium alloys; copper alloys; metallic thin films; metallisation; random noise; statistical analysis; 1/f2 noise generation model; Al-Cu thin films; current-density-dependent noise activation energy; noise response; single-measurement-per-film methodology; statistical analysis; statistical approach; Cows; Current density; Density measurement; Frequency; Large Hadron Collider; Noise measurement; Temperature; Tiles; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Southeastcon '89. Proceedings. Energy and Information Technologies in the Southeast., IEEE
Conference_Location :
Columbia, SC
Type :
conf
DOI :
10.1109/SECON.1989.132632
Filename :
132632
Link To Document :
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