DocumentCode :
3333298
Title :
Fast kVp-switching dual energy CT for PET attenuation correction
Author :
Huh, Wonseok ; Fessler, Jeffrey A. ; Alessio, Adam M. ; Kinahan, Paul E.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
fYear :
2009
fDate :
Oct. 24 2009-Nov. 1 2009
Firstpage :
2510
Lastpage :
2515
Abstract :
X-ray CT images are used routinely for attenuation correction in PET/CT systems. However, conventional CT-based attenuation correction (CTAC) can be inaccurate in regions containing iodine contrast agent. Dual-energy (DE) CT has the potential to improve the accuracy of attenuation correction in PET, but conventional DECT can suffer from motion artifacts. Recent X-ray CT systems can collect DE sinograms by rapidly switching the X-ray tube voltage between two levels for alternate projection views, reducing motion artifacts. The goal of this work is to study statistical methods for image reconstruction from both fast kVp-switching DE scans and from conventional dual-rotate DE scans in the context of CTAC for PET.
Keywords :
computerised tomography; image reconstruction; medical image processing; motion compensation; positron emission tomography; CT based attenuation correction; CTAC; DECT; PET attenuation correction; PET-CT systems; X-ray CT images; X-ray tube voltage; computerised tomography; dual energy CT; dual energy sinograms; dual rotate DE scans; fast source voltage switching CT; image reconstruction; iodine contrast agent; motion artifacts; positron emission tomography; Attenuation; Biological materials; Computed tomography; Image reconstruction; Nuclear and plasma sciences; Optical imaging; Positron emission tomography; Statistical analysis; Voltage; X-ray imaging; attenuation correction factors; dual-energy X-ray computed tomography; model-based image reconstruction; penalized weighted least squares method;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location :
Orlando, FL
ISSN :
1095-7863
Print_ISBN :
978-1-4244-3961-4
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2009.5402036
Filename :
5402036
Link To Document :
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