Title :
Detection of hot spots in thin metal films using an ultra sensitive dual channel noise measurement system
Author :
Massiha, G.H. ; Scott, G.J. ; Chen, T.M.
Author_Institution :
Dept. of Electr. Eng., South Florida Univ., Tampa, FL, USA
Abstract :
A dual-channel noise measurement system capable of detecting the thermal noise of a 1-Ω resistor at room temperature was designed and constructed. The system was based on amplifying the noise signal under detection through two separated channels and taking the cospectrum estimate of the output of two channels. The system was used to measure the thermal noise and compare effective noise temperatures in electromigration-damaged and undamaged thin aluminium films
Keywords :
aluminium; electric noise measurement; electromigration; metallic thin films; metallisation; thermal noise; Al films; cospectrum estimate; dual channel noise measurement system; effective noise temperatures; electromigration damage; hot spot detection; noise signal amplification; thermal noise; thin metal films; Noise figure; Noise generators; Noise level; Noise measurement; Resistors; Strips; Temperature sensors; Thermal resistance; Transistors; Voltage;
Conference_Titel :
Southeastcon '89. Proceedings. Energy and Information Technologies in the Southeast., IEEE
Conference_Location :
Columbia, SC
DOI :
10.1109/SECON.1989.132634
