• DocumentCode
    3333663
  • Title

    System reliability analysis considering fatal and non-fatal shocks in a fault tolerant system

  • Author

    Xing, Liudong ; Boddu, Prashanthi ; Sun, Yan

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Massachusetts, North Dartmouth, MA
  • fYear
    2009
  • fDate
    26-29 Jan. 2009
  • Firstpage
    436
  • Lastpage
    441
  • Abstract
    Systems designed with fault-tolerance techniques are typically subject to common-cause shocks. Failure to consider common-cause shocks in the system reliability analysis leads to optimistic results, which makes the reliability analysis less effective in the system design and turning activities. In this paper, we consider two types of common-cause shocks: fatal and non-fatal in the reliability evaluation of fault-tolerant systems. A fatal shock will fail all components of a system, while a non-fatal shock causes the affected components to fail with different probabilities. Hierarchical combinatorial approaches and a Markov approach have been proposed for incorporating common-cause shocks in the reliability analysis of static and dynamic systems, respectively. The basics of the proposed approaches and effects of common-cause shocks on the system reliability are illustrated through examples.
  • Keywords
    Markov processes; combinatorial mathematics; fault tolerance; power system faults; power system reliability; Markov approach; dynamic systems; fatal shocks; fault tolerant system; hierarchical combinatorial approaches; nonfatal shocks; static systems; system design; system reliability analysis; turning activities; Boolean functions; Data structures; Design optimization; Electric shock; Failure analysis; Fault tolerant systems; Independent component analysis; Reliability; Sun; System analysis and design; Binary decision diagram; Poisson decomposition; reliability; shock;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 2009. RAMS 2009. Annual
  • Conference_Location
    Fort Worth, TX
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4244-2508-2
  • Electronic_ISBN
    0149-144X
  • Type

    conf

  • DOI
    10.1109/RAMS.2009.4914716
  • Filename
    4914716