Title :
Improving supply chain visibility through RFID data
Author :
Melski, Adam ; Müller, Jürgen ; Zeier, Alexander ; Schumann, Matthias
Author_Institution :
Inst. for Inf. Syst., Univ. of Goettingen, Gottingen
Abstract :
In our work, which is still in progress, we examine the visibility potentials of RFID technology within the context of Supply Chain Management (SCM). This analysis is conducted systematically by matching identified SCM visibility requirements and general RFID visibility potentials. Building on a four-step approach, we show how visibility in supply chains can be improved on the basis of RFID-generated data, and what impact this increase in visibility has on the goals of SCM.
Keywords :
radiofrequency identification; supply chain management; RFID data; RFID technology; radio frequency identification; supply chain management; supply chain visibility; Data engineering; Information systems; Information technology; Radiofrequency identification; Software systems; Supply chain management; Supply chains; Systems engineering and theory; Tagging; Technology management;
Conference_Titel :
Data Engineering Workshop, 2008. ICDEW 2008. IEEE 24th International Conference on
Conference_Location :
Cancun
Print_ISBN :
978-1-4244-2161-9
Electronic_ISBN :
978-1-4244-2162-6
DOI :
10.1109/ICDEW.2008.4498295
