Title :
Sensitivity approach to statistical signal integrity analysis of coupled interconnect trees
Author :
Hao, Zhigang ; Shi, Guoyong
Author_Institution :
Sch. of Microelectron., Shanghai Jiao Tong Univ., Shanghai, China
Abstract :
Capacitive and inductive coupling issues are hard to analyze in general; however, they are critical for signal integrity (SI) analysis in the contemporary integrated circuit technology. This paper presents a sensitivity based computation approach to coupled RLC trees for statistical signal integrity analysis. This technique is intended for use in SI-driven placement and routing.
Keywords :
integrated circuit interconnections; network analysis; sensitivity analysis; statistical analysis; trees (mathematics); SI-driven placement; capacitive coupling; contemporary integrated circuit technology; coupled RLC trees; coupled interconnect trees; inductive coupling; sensitivity based computation approach; statistical signal integrity analysis; Algorithm design and analysis; Circuit analysis computing; Coupling circuits; Integrated circuit interconnections; Iterative algorithms; RLC circuits; Routing; Signal analysis; Signal design; Timing;
Conference_Titel :
Circuits and Systems, 2009. MWSCAS '09. 52nd IEEE International Midwest Symposium on
Conference_Location :
Cancun
Print_ISBN :
978-1-4244-4479-3
Electronic_ISBN :
1548-3746
DOI :
10.1109/MWSCAS.2009.5236114
