Title :
A de-embedding method to improve RFICs testing errors due to radiated electromagnetic interference
Author_Institution :
Commun. Res. Center, Oriental Inst. of Technol., Taipei, Taiwan
Abstract :
When conducting a RFIC performance testing, a sensor for measuring ambient EM signals was used to determine whether interference was the cause of the reported testing error. Upon detecting a testing error, a de-embedding procedure was actuated to recover the testing error and to improve yield-loss. For theoretical validation, Monte-Carlo procedure was applied in a “Source-Path-Victim” model to simulate the effect of electromagnetic interference (EMI) on RFIC measurement.
Keywords :
electromagnetic interference; integrated circuit testing; radiofrequency integrated circuits; sensors; EM signals; Monte-Carlo procedure; RFIC measurement; RFIC performance testing; RFIC testing errors; de-embedding method; radiated electromagnetic interference; sensor; source-path-victim model; Bit error rate; Degradation; Electromagnetic interference; Radiofrequency integrated circuits; Receivers;
Conference_Titel :
Electromagnetics, Applications and Student Innovation (iWEM), 2011 IEEE International Workshop on
Conference_Location :
Taipei
Print_ISBN :
978-1-61284-462-6
Electronic_ISBN :
978-1-61284-461-9
DOI :
10.1109/iWEM.2011.6021476