• DocumentCode
    3333896
  • Title

    High-selectivity reactive ion etching with CO/NH3/Xe gas for micro/nanostructuring of 20% Fe-Ni, Au, Pt, and Cu

  • Author

    Abe, Takashi ; Youn Gi Hong ; Esashi, Masayoshi

  • Author_Institution
    Graduate Sch. of Eng., Tohoku Univ., Sendai, Japan
  • fYear
    2003
  • fDate
    19-23 Jan. 2003
  • Firstpage
    574
  • Lastpage
    577
  • Abstract
    Highly selective etch process for conductive metals (Au, Pt, and Cu) and magnetic metal (20%Fe-Ni) has been developed on a magnetron reactive ion etching system which uses a CO/NH3/Xe chemistry. Etch selectivities of these metals to titanium greater than 80:1 for Au, 40:1 for Pt, 30:1 for Cu, and 15:1 for Permalloy (20%Fe-Ni) were achieved at a titanium etch rate of 1.0 nm/min. These etchings were carried out at a room temperature. We found out that a little addition of Xe to CO/NH3 gases (molar ratio=1/7) shows both ion assist etching of these metals and nitridation of titanium mask thus resulting in the good selectivity. These etch selectivities were enhanced about three times greater than that obtained without Xe.
  • Keywords
    Permalloy; copper; gold; iron alloys; nanotechnology; nickel alloys; platinum; sputter etching; surface hardening; titanium; 20%Fe-Ni; Au; CO-NH3-Xe; CO/NH3/Xe gas; Cu; Fe-Ni; Pt; Ti mask; etch selectivities; high-selectivity reactive ion etching; ion assist etching; magnetron reactive ion etching system; microstructuring; nanostructuring; nitridation; selectivity; Gold; Magnetic anisotropy; Magnetic materials; Magnetic sensors; Perpendicular magnetic anisotropy; Plasma applications; Plasma chemistry; Plasma temperature; Sputter etching; Titanium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 2003. MEMS-03 Kyoto. IEEE The Sixteenth Annual International Conference on
  • ISSN
    1084-6999
  • Print_ISBN
    0-7803-7744-3
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2003.1189814
  • Filename
    1189814