High-resolution alpha spectrometry with a thin-window silicon carbide semiconductor detector

Author

Ruddy, Frank H. ; Seidel, John G. ; Sellin, Paul

Author_Institution

Ruddy Consulting, Mount Pleasant, SC, USA

fYear

2009

fDate

Oct. 24 2009-Nov. 1 2009

Firstpage

2201

Lastpage

2206

Abstract

The potential for high-resolution alpha-particle energy spectrometry in high-temperature, high-radiation environments using thin-window 4H-SiC radiation detectors has been demonstrated. ²³⁸Pu alpha-particle peaks separated by only 42.7 keV have been completely resolved using a SiC Schottky detector with a 400 AÂ¿ titanium Schottky contact (entrance window). The observed FWHM for the ²³⁸Pu 5499.2-keV alpha particle peak is 20.6 keV or 0.37%. Factors affecting the observed alpha-particle energy resolution in SiC detectors will be discussed.

Keywords

Schottky barriers; alpha-particle spectroscopy; semiconductor counters; semiconductor-metal boundaries; silicon compounds; titanium; ²³⁸Pu alpha particle peaks; SiC; Ti; alpha particle energy resolution; alpha particle energy spectrometry; electron volt energy 5499.2 keV; high radiation environments; high resolution alpha spectrometry; high temperature environments; silicon carbide Schottky detector; silicon carbide semiconductor detector; thin window semiconductor detector; titanium Schottky contact; Alpha particles; Energy measurement; Energy resolution; Radiation detectors; Schottky barriers; Schottky diodes; Semiconductor radiation detectors; Silicon carbide; Spectroscopy; Titanium;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE

Conference_Location

Orlando, FL

ISSN

1095-7863

Print_ISBN

978-1-4244-3961-4

Electronic_ISBN

1095-7863

Type

conf

DOI

10.1109/NSSMIC.2009.5402072

Filename

5402072