The use of parasitic elements to remove potential E-plane scan blindnesses in high dielectric substrate microstrip patch probe-fed phased arrays

The effect of parasitic elements on the scan performance of probe-fed microstrip patch arrays is thoroughly investigated using a rigorous full-wave analysis. In the analysis the probe feed is accurately modelled using a special attachment mode [Aberle and Pozar, 1991], thus providing accurate scan impedance variation and other related scanning characteristics. A technique is introduced that significantly reduces the reflection coefficient magnitude at potential scan blindnesses, without losing power to a grating lobe. This method is suitable for patches mounted on high dielectric material, due to the small size of these elements (relative to the free space wavelength, /spl lambda//sub 0/).<>