• DocumentCode
    333398
  • Title

    Parameterized characterization of elliptic sperm heads using Fourier representation and wavelet transform

  • Author

    Yi, W.J. ; Park, K.S. ; Paick, J.S.

  • Author_Institution
    Seoul Nat. Univ., South Korea
  • Volume
    2
  • fYear
    1998
  • fDate
    29 Oct-1 Nov 1998
  • Firstpage
    974
  • Abstract
    In this paper, we have studied a new method of sperm morphological classification using Fourier representation and a dyadic wavelet transform (WT). Sperm head boundaries with elliptic shape were parameterized by discrete Fourier transform and reconstructed with dyadic data points. The enclosed area of boundaries as a classification feature was calculated and transformed by wavelet transform. At successive dyadic resolution levels, the root-mean-square distances from the four standard classes were calculated and the boundary was classified into its nearest. The results suggest that if we have sufficiently large databases, the classification by wavelet decomposition is reliable and can be clinically used as a substitution
  • Keywords
    discrete Fourier transforms; edge detection; image classification; image segmentation; medical image processing; wavelet transforms; Fourier representation; classification feature; discrete Fourier transform; dyadic data points; dyadic wavelet transform; edge operator; elliptic sperm heads; enclosed area of boundaries; grey level histogram; image segmentation; microscopic sperm images; parameterized characterization; recurrent filtering; root-mean-square distances; sperm head boundaries; sperm morphological classification; wavelet decomposition; Biomedical engineering; Discrete Fourier transforms; Discrete wavelet transforms; Fourier transforms; Head; Image reconstruction; Image segmentation; Morphology; Spatial resolution; Wavelet transforms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 1998. Proceedings of the 20th Annual International Conference of the IEEE
  • Conference_Location
    Hong Kong
  • ISSN
    1094-687X
  • Print_ISBN
    0-7803-5164-9
  • Type

    conf

  • DOI
    10.1109/IEMBS.1998.745610
  • Filename
    745610