Title : 
A T-matched dipole antenna with a dielectric superstrate for UHF RFID tag
         
        
            Author : 
Wei-Chih Chen ; Hua-Ming Chen ; Yi-Fang Lin ; Jyun-Wei Jhuang ; Sue-Wei Chang ; Chien-Hung Chen
         
        
            Author_Institution : 
Inst. of Photonics & Commun., Nat. Kaohsiung Univ. of Appl. Sci., Kaohsiung, Taiwan
         
        
        
        
        
        
            Abstract : 
This paper describes a high impedance matched dipole antenna, which is comprised of an inductive T-matched loop and a small bent dipole radiator with a slit for UHF RFID tag design. The overall dimension of the tag antenna is 36 mm × 28 mm. The input impedance of the designed tag antenna is 49.2+j787.6 Ω and is conjugately matched to a FEC-MMGen2/MM3BS microchip with an impedance of 49.2-j787.6 Ω at 915 MHz. The T-matched coupling mechanism can excite dual-mode to enhance the impedance bandwidth for solving the narrow bandwidth of the RFID tag. The maximum read range of the prototype with a superstrate can reach approximately 2.4 m, which has been tested for an RFID reader with 4.0 W of EIRP. Good tag sensitivity and orientation radiation patterns were obtained in the desired frequency band.
         
        
            Keywords : 
UHF antennas; antenna radiation patterns; dipole antennas; impedance matching; radiofrequency identification; FEC-MMGen2/MM3BS microchip; T-matched coupling mechanism; T-matched dipole antenna; UHF RFID tag design; dielectric superstrate; frequency 915 MHz; high-impedance matched dipole antenna; impedance bandwidth; inductive T-matched loop; orientation radiation patterns; radiofrequency identification; small-bent dipole radiator; tag sensitivity; Antenna measurements; Dipole antennas; Frequency measurement; Impedance; Radiofrequency identification; UHF antennas;
         
        
        
        
            Conference_Titel : 
Electromagnetics, Applications and Student Innovation (iWEM), 2011 IEEE International Workshop on
         
        
            Conference_Location : 
Taipei
         
        
            Print_ISBN : 
978-1-61284-462-6
         
        
            Electronic_ISBN : 
978-1-61284-461-9
         
        
        
            DOI : 
10.1109/iWEM.2011.6021483