DocumentCode :
3334078
Title :
A novel micro-scale recombining technique using lateral joining for a large-area molding with small features
Author :
Wu, Chih-Wei ; Huang, Long-Sun ; Chang, Jer-Haur ; Yang, Sen-Yeu ; Lee, Chih-Kung
Author_Institution :
Inst. of Appl. Mech., Nat. Taiwan Univ., Taipei, Taiwan
fYear :
2003
fDate :
19-23 Jan. 2003
Firstpage :
622
Lastpage :
625
Abstract :
A novel micro-scale recombining technique using a lateral joining of silicon crystal planes is first presented. The new concept of the technique is realized by fabricating a large silicon molding plate beyond a wafer size with small features. The replication of the joint plate using the hot embossing technique has been characterized in surface profiles, pictures, and optical performance. Both experiment and simulation results reached good agreement in diffractive optical intensity. Furthermore, the scalability of the technique was extensively demonstrated with three silicon wafers. As a result, the novel technique provides a potentially low-cost approach to fill the technology gap between the conventional precision machining and photolithography-based micromachining for a beyond-wafer-size silicon plate with small features.
Keywords :
joining processes; micromachining; micromechanical devices; moulding; silicon; Si; Si crystal planes; diffractive optical intensity; hot embossing technique; joint plate; large silicon molding plate; large-area molding; lateral joining; micro-scale recombining technique; optical performance; photolithography-based micromachining; pictures; small features; surface profiles; Anisotropic magnetoresistance; Biomedical optical imaging; Embossing; Etching; Fabrication; Liquid crystals; Machining; Optical films; Production; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems, 2003. MEMS-03 Kyoto. IEEE The Sixteenth Annual International Conference on
ISSN :
1084-6999
Print_ISBN :
0-7803-7744-3
Type :
conf
DOI :
10.1109/MEMSYS.2003.1189826
Filename :
1189826
Link To Document :
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