Title :
A test controller board for TSS
Author :
Kornegay, K.T. ; Brodersen, R.W.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
Abstract :
The design of a test controller board for a test support system is presented in this paper. Driven by the SCANTEST software, the test controller board exercises the boundary-scan and scan-path and built-in-self-test hardware implemented on the device under test via a dedicated test-bus. An analog test feature is also described
Keywords :
automatic test equipment; built-in self test; integrated circuit testing; logic testing; ATE; BIST; SCANTEST software; analog test feature; boundary-scan; built-in-self-test; dedicated test-bus; scan-path; test controller board; test support system; Automatic testing; Built-in self-test; Circuit testing; Control systems; Design for testability; Hardware; Process design; Sequential analysis; Software testing; System testing;
Conference_Titel :
VLSI, 1991. Proceedings., First Great Lakes Symposium on
Conference_Location :
Kalamazoo, MI
Print_ISBN :
0-8186-2170-2
DOI :
10.1109/GLSV.1991.143939
