• DocumentCode
    3334158
  • Title

    Computer modelling of charging and polarization phenomena in dielectrics

  • Author

    Koikou, Serguej N.

  • Author_Institution
    St. Petersburg State Tech. Univ., Russia
  • fYear
    1996
  • fDate
    25-30 Sep 1996
  • Firstpage
    311
  • Lastpage
    316
  • Abstract
    Author developed a block of programs for computer modelling of charge storage and relaxation, effect of charge transport in dielectrics, taking into account the nature of contacts between electrodes and dielectric, the interfacial phenomena, the processes of trapping and recombination of charge carriers. The theoretical results are discussed and compared with some experimental data
  • Keywords
    dielectric polarisation; dielectric relaxation; electron traps; electron-hole recombination; carrier recombination; carrier trapping; charge relaxation; charge storage; charge transport; computer model; dielectric; electrode contact; interfacial phenomena; polarization; Boundary conditions; Charge carrier processes; Charge carriers; Clouds; Computer interfaces; Dielectric breakdown; Differential equations; Electric breakdown; Electrodes; Polarization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrets, 1996. (ISE 9), 9th International Symposium on
  • Conference_Location
    Shanghai
  • Print_ISBN
    0-7803-2695-4
  • Type

    conf

  • DOI
    10.1109/ISE.1996.578089
  • Filename
    578089