Title :
Computer modelling of charging and polarization phenomena in dielectrics
Author :
Koikou, Serguej N.
Author_Institution :
St. Petersburg State Tech. Univ., Russia
Abstract :
Author developed a block of programs for computer modelling of charge storage and relaxation, effect of charge transport in dielectrics, taking into account the nature of contacts between electrodes and dielectric, the interfacial phenomena, the processes of trapping and recombination of charge carriers. The theoretical results are discussed and compared with some experimental data
Keywords :
dielectric polarisation; dielectric relaxation; electron traps; electron-hole recombination; carrier recombination; carrier trapping; charge relaxation; charge storage; charge transport; computer model; dielectric; electrode contact; interfacial phenomena; polarization; Boundary conditions; Charge carrier processes; Charge carriers; Clouds; Computer interfaces; Dielectric breakdown; Differential equations; Electric breakdown; Electrodes; Polarization;
Conference_Titel :
Electrets, 1996. (ISE 9), 9th International Symposium on
Conference_Location :
Shanghai
Print_ISBN :
0-7803-2695-4
DOI :
10.1109/ISE.1996.578089
