Title :
Compendium of Total Ionizing Dose Results and Displacement Damage Results for Candidate Spacecraft Electronics for NASA
Author :
Cochran, Donna J. ; Kniffin, Scott D. ; Buchner, Stephen P. ; LaBel, Kenneth A. ; O´Bryan, Martha V. ; Ladbury, Raymond L. ; Sanders, Anthony B. ; Hawkins, Donald K. ; Cox, Stephen R. ; Poivey, Christian F. ; Oldham, Timothy R. ; Kim, Hak ; Irwin, Tim L.
Abstract :
Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage is studied. Devices tested include optoelectronics, digital, analog, linear bipolar devices, and hybrid devices
Keywords :
dosimetry; radiation hardening (electronics); space vehicle electronics; displacement damage; proton damage; single event effects; spacecraft electronics; total ionizing dose; Aerospace electronics; Cyclotrons; Electronic equipment testing; NASA; Protons; Radiation effects; Space technology; Space vehicles; Test facilities; USA Councils; Displacement Damage; Proton Damage; Single Event Effects; Total Ionizing Dose; optoelectronics;
Conference_Titel :
Radiation Effects Data Workshop, 2006 IEEE
Conference_Location :
Ponte Vedra, FL
Print_ISBN :
1-4244-0638-2
DOI :
10.1109/REDW.2006.295461
