Title :
Compendia of Radiation Test Results of Integrated Circuits
Author :
Layton, Phil ; Gilbert, Charlie ; Patnaude, Ed ; Williamson, Gale ; Longden, Larry ; Sloan, Clancy
Author_Institution :
Maxwell Technol., San Diego, CA
Abstract :
TID and SEE data was taken to qualify and evaluate IC devices for radiation susceptibility in the natural space environment. A summary of the test data is presented and discussed
Keywords :
dosimetry; integrated circuit testing; radiation hardening (electronics); integrated circuits; radiation susceptibility; radiation test data; single event effects; total ionizing dose; Circuit testing; Gold; Integrated circuit testing; Performance analysis; Performance evaluation; Pulse width modulation; Single event upset; Space technology; Space vector pulse width modulation; Voltage; Radiation; Test Data;
Conference_Titel :
Radiation Effects Data Workshop, 2006 IEEE
Conference_Location :
Ponte Vedra, FL
Print_ISBN :
1-4244-0638-2
DOI :
10.1109/REDW.2006.295462
