• DocumentCode
    3334347
  • Title

    Manipulation of multiple droplets on N×M grid by cross-reference EWOD driving scheme and pressure-contact packaging

  • Author

    Fan, Shih-Kang ; Hashi, Craig ; Kim, Chang-Jin

  • Author_Institution
    Mech. & Aerosp. Eng. Dept., California Univ., Los Angeles, CA, USA
  • fYear
    2003
  • fDate
    19-23 Jan. 2003
  • Firstpage
    694
  • Lastpage
    697
  • Abstract
    This paper reports two recent breakthroughs in our development of EWOD-based (ElectroWetting On Dielectric) digital (droplet) microfluidic circuits: a driving scheme and a packaging scheme, both of which greatly simplify fabrication and make large-array chips a reality. This paper will explain (1) the concept of cross-reference driving, which allows single-layer electrode fabrication, including the techniques to allow simultaneous driving of multiple droplets and (2) pressure-contact connection, which greatly simplifies packaging and assembly for high-density EWOD devices. The efficacy of the driving concept is demonstrated by transporting four droplets simultaneously, each along its own path, on a 9×9 grid and performing essential fluidic functions such as creation, cutting, merging, and mixing of droplets.
  • Keywords
    drops; electrophoresis; microfluidics; packaging; wetting; N×M grid; creation; cross-reference EWOD driving scheme; cross-reference driving; cutting; electrowetting on dielectric digital microfluidic circuits; large-array chips; merging; mixing; multiple droplets; multiple droplets manipulation; pressure-contact connection; pressure-contact packaging; simultaneous driving; single-layer electrode fabrication; Aerospace engineering; Assembly; Circuits; Dielectrics; Electrodes; Fabrication; Microfluidics; Packaging; Telephony; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 2003. MEMS-03 Kyoto. IEEE The Sixteenth Annual International Conference on
  • ISSN
    1084-6999
  • Print_ISBN
    0-7803-7744-3
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2003.1189844
  • Filename
    1189844