• DocumentCode
    3334351
  • Title

    Results of Single-Event Effects Measurements Conducted by the Jet Propulsion Laboratory

  • Author

    Irom, Farokh ; Miyahira, Tetsuo F.

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA
  • fYear
    2006
  • fDate
    38899
  • Firstpage
    37
  • Lastpage
    42
  • Abstract
    This paper reports recent single-event effects results for a variety of microelectronic devices that include an ADC, DAC, supervisory circuit, FIFO and a Viterbi decoder. The data was collected to evaluate these devices for possible use in NASA
  • Keywords
    Viterbi decoding; analogue-digital conversion; avionics; radiation hardening (electronics); reference circuits; ADC; DAC; FIFO; NASA; Viterbi decoder; heavy ion; jet propulsion laboratory; latchup; microelectronic devices; single-event effects measurements; supervisory circuit; Circuits; Cyclotrons; Ion beams; Laboratories; Power supplies; Propulsion; Single event upset; Space technology; Temperature; Testing; Cyclotron; Latchup; SEE; heavy ion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2006 IEEE
  • Conference_Location
    Ponte Vedra, FL
  • Print_ISBN
    1-4244-0638-2
  • Type

    conf

  • DOI
    10.1109/REDW.2006.295465
  • Filename
    4077279
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3334351