DocumentCode
3334355
Title
Electronic measurement of microchannel plate pulse height distributions
Author
Gamboa, E.J. ; Harding, E.C. ; Huntington, C.M. ; Drake, R.P.
Author_Institution
Univ. of Michigan, Ann Arbor, MI, USA
fYear
2010
fDate
20-24 June 2010
Firstpage
1
Lastpage
1
Abstract
Microchannel plates are a central component to the x-ray framing cameras used in many plasma experiment diagnostic systems. The microchannel plate serves as an amplifying element, increasing the electronic signal from incident radiation by a factor of $10^3-10^5$, with a broad pulse-height distribution. Seeking to optimize the photon-to-electron conversion efficiency and noise distribution of x-ray cameras, we will characterize the pulse-height distribution of the electron output from a single microchannel plate. Replacing the framing camera´s phosphor-coated fiber optic screen with a charge-collection plate and coupling to a low-noise multichannel analyzer, we will quantify the total charge generated per photon event over a range of x-ray energies and incident fluxes. The electronically-measured pulse height distribution will be compared to the same data collected via a purely-optical method, as described previously.
Keywords
plasma diagnostics; amplifying element; charge-collection plate; electronic measurement; electronic signal; incident fluxes; incident radiation; low-noise multichannel analyzer; microchannel plate pulse height distributions; noise distribution; photon-to-electron conversion efficiency; plasma experiment diagnostic systems; x-ray energies; x-ray framing cameras; Cameras; Electrons; Microchannel; Optical noise; Optical pulses; Plasma diagnostics; Plasma measurements; Plasma x-ray sources; Pulse amplifiers; Pulse measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 2010 Abstracts IEEE International Conference on
Conference_Location
Norfolk, VA
ISSN
0730-9244
Print_ISBN
978-1-4244-5474-7
Electronic_ISBN
0730-9244
Type
conf
DOI
10.1109/PLASMA.2010.5534300
Filename
5534300
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