DocumentCode :
3334362
Title :
Fault diagnosis in complex digital circuits
Author :
Subramanian, Krishnan ; Billmers, Meyer ; Sitterly, Scott ; Baker, Paul
Author_Institution :
Digitl Equipment Corp., Marlboro, MA, USA
fYear :
1989
fDate :
6-10 Mar 1989
Firstpage :
159
Lastpage :
164
Abstract :
A methodology is presented for diagnosing faults in complex, evolving digital circuits. The authors believe, however, that the analysis and the methods described can be applied to diagnose faults in the generic flow circuit, namely, information networks, thermal circuits, etc. A model useful for fault diagnosis is developed, and its application to troubleshooting digital circuits is discussed. The method involves three key steps: a given complex circuit may have to be transformed to a simpler representation, to one that corresponds to the model; basic techniques identified using the model can then be applied to troubleshoot it; and appropriate extensions may be needed for additional domain-specific or circuit-specific fault handling. A system that implements the methodology has been developed, and has been used to successfully troubleshoot a candidate complex digital circuit (of about 5-10% of the complexity of a VAX CPU)
Keywords :
circuit analysis computing; fault location; knowledge based systems; VAX CPU; complex digital circuits; fault diagnosis; fault handling; generic flow circuit; information networks; thermal circuits; troubleshooting; Artificial intelligence; Circuit faults; Circuit testing; Degradation; Digital circuits; Fault diagnosis; Information analysis; Trademarks; Uncertainty; Variable speed drives;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Artificial Intelligence Applications, 1989. Proceedings., Fifth Conference on
Conference_Location :
Miami, FL
Print_ISBN :
0-8186-1902-3
Type :
conf
DOI :
10.1109/CAIA.1989.49149
Filename :
49149
Link To Document :
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