• DocumentCode
    3334423
  • Title

    Field uniformity in standard TEM cells

  • Author

    Slattery, Kevin P. ; Neal, Jeffrey

  • Author_Institution
    FF Dev. USA Inc., Huntsville, AL, USA
  • fYear
    195
  • fDate
    14-18 Aug 195
  • Firstpage
    534
  • Lastpage
    537
  • Abstract
    The longitudinal and transverse field characteristics of a standard TEN cell rated to 200 MHz are described. Data was collected using a 3 axis electric field probe optically coupled to control instrumentation. Several instances were investigated. First, power requirements to establish a theoretical 70 Volt/meter field in the cell were determined. Using these settings, the field was then measured in a volume consisting of 40 individual points. In a second series of measurements, the field was measured in the volume surrounding a metallic DUT. Thirdly, the TEM cell structure was studied analytically to determine the current density distribution in the septum and top and bottom walls. The data reveals field gradients in the central volume of the cell and a resonance at 161 MHz that is positionally dependent. In addition, field uniformity is shown to be quite good until 161 MHz. Beyond 161 MHz, the field gradients increase
  • Keywords
    current density; current distribution; electric field measurement; electromagnetic compatibility; 161 MHz; 200 MHz; EMC; control instrumentation; current density distribution; electric field probe; field gradients; field measurement; field uniformity; longitudinal field characteristics; metallic DUT; power requirements; septum; standard TEM cells; transverse field characteristics; Current distribution; Degradation; Optical control; Optical coupling; Position measurement; Probes; Resonance; Standards development; TEM cells; Volume measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1995. Symposium Record., 1995 IEEE International Symposium on
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    0-7803-3608-9
  • Type

    conf

  • DOI
    10.1109/ISEMC.1995.523615
  • Filename
    523615