DocumentCode :
3334457
Title :
Measurements of Radiation Effects on Optoelectronics Conducted by the Jet Propulsion Laboratory
Author :
Miyahira, Tetsuo F. ; Irom, Farokh ; Johnston, Allan H.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA
fYear :
2006
fDate :
38899
Firstpage :
72
Lastpage :
76
Abstract :
This paper reports radiation test results for variety of optoelectronic devices that includes LEDs, optocouplers, and photo transistors. The data was collected to evaluate these devices for possible use in NASA spacecrafts
Keywords :
avionics; light emitting diodes; opto-isolators; optoelectronic devices; phototransistors; radiation hardening (electronics); Jet Propulsion Laboratory; LED; NASA spacecrafts; optocouplers; optoelectronic device; phototransistors; radiation effects; Degradation; Laboratories; Light emitting diodes; Optoelectronic devices; Phototransistors; Propulsion; Protons; Radiation effects; Space technology; Testing; LED; damage; proton; radiation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation Effects Data Workshop, 2006 IEEE
Conference_Location :
Ponte Vedra, FL
Print_ISBN :
1-4244-0638-2
Type :
conf
DOI :
10.1109/REDW.2006.295471
Filename :
4077285
Link To Document :
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