Title :
Total Dose and Dose Rate Response of Low Dropout Voltage Regulators
Author :
Pease, Ronald L. ; Dunham, Gary W. ; Seiler, John E.
Author_Institution :
RLP Res., Los Lunas, NM
Abstract :
The total dose response of three bipolar low dropout voltage regulators is presented for a variety of irradiation and anneal test conditions. Two of the part types were chosen for their known enhanced low dose rate sensitivity (ELDRS) and the third for its known radiation tolerance. The two ELDRS parts show a dramatic sensitivity to irradiation bias with the all leads shorted being worst case at low dose rate. The responses at 10 mrad/s and 2.3 mrad/s are similar in magnitude, indicating that the low dose rate enhancement factor has leveled off below 10 mrad/s. Elevated temperature irradiation at 100degC and 5 rad/s does not simulate the low dose rate response
Keywords :
radiation hardening (electronics); voltage regulators; 100 C; bipolar low dropout voltage regulators; dose rate response; enhanced low dose rate sensitivity; radiation tolerance; total dose response; Annealing; Circuit testing; Cranes; Current measurement; Electric variables measurement; Low voltage; Plastic packaging; Regulators; Space technology; Temperature; Dose rate; Radiation effects; Total ionizing dose; Voltage regulators;
Conference_Titel :
Radiation Effects Data Workshop, 2006 IEEE
Conference_Location :
Ponte Vedra, FL
Print_ISBN :
1-4244-0638-2
DOI :
10.1109/REDW.2006.295473
