Title :
Single Event Upset Characterization of the Virtex-4 Field Programmable Gate Array Using Proton Irradiation
Author :
Hiemstra, David M. ; Chayab, Fayez ; Mohammed, Zaeem
Author_Institution :
MDA, Brampton, Ont.
Abstract :
Proton induced SEU cross-sections of functional blocks and the SRAM which stores the logic configuration of the Virtex-4 FPGA are presented. Upset rates in the space radiation environment are estimated
Keywords :
SRAM chips; field programmable gate arrays; proton effects; radiation hardening (electronics); SRAM; Virtex-4 FPGA; Virtex-4 field programmable gate array; logic configuration; proton irradiation; single event upset characterization; Circuit testing; Field programmable gate arrays; Hardware; Logic devices; Logic testing; Programmable logic arrays; Protons; Random access memory; Single event upset; Telephony; SRAM FPGA; proton irradiation; single event upset;
Conference_Titel :
Radiation Effects Data Workshop, 2006 IEEE
Conference_Location :
Ponte Vedra, FL
Print_ISBN :
1-4244-0638-2
DOI :
10.1109/REDW.2006.295476
