• DocumentCode
    3334560
  • Title

    Single Event Upsets in Xilinx Virtex-4 FPGA Devices

  • Author

    George, J. ; Koga, R. ; Swift, G. ; Allen, G. ; Carmichael, C. ; Tseng, C.W.

  • Author_Institution
    Aerosp. Corp., El Segundo, CA
  • fYear
    2006
  • fDate
    17-21 July 2006
  • Firstpage
    109
  • Lastpage
    114
  • Abstract
    We present single event upset sensitivities for three Xilinx Virtex-4 field-programmable-gate-array (FPGA) devices in protons and heavy ions. Upsets are identified in each functional block and results compared with previous device generations
  • Keywords
    field programmable gate arrays; radiation hardening (electronics); Xilinx Virtex-4 FPGA; Xilinx Virtex-4 field-programmable-gate-array devices; heavy ions; protons; single event upsets; Clocks; Field programmable gate arrays; Frequency conversion; Laboratories; Logic devices; Protons; Read-write memory; Single event upset; Table lookup; Testing; field programmable gate arrays; radiation effects; single event effects;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2006 IEEE
  • Conference_Location
    Ponte Vedra, FL
  • Print_ISBN
    1-4244-0638-2
  • Type

    conf

  • DOI
    10.1109/REDW.2006.295477
  • Filename
    4077291
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3334560