Title :
Single Event Upsets in Xilinx Virtex-4 FPGA Devices
Author :
George, J. ; Koga, R. ; Swift, G. ; Allen, G. ; Carmichael, C. ; Tseng, C.W.
Author_Institution :
Aerosp. Corp., El Segundo, CA
Abstract :
We present single event upset sensitivities for three Xilinx Virtex-4 field-programmable-gate-array (FPGA) devices in protons and heavy ions. Upsets are identified in each functional block and results compared with previous device generations
Keywords :
field programmable gate arrays; radiation hardening (electronics); Xilinx Virtex-4 FPGA; Xilinx Virtex-4 field-programmable-gate-array devices; heavy ions; protons; single event upsets; Clocks; Field programmable gate arrays; Frequency conversion; Laboratories; Logic devices; Protons; Read-write memory; Single event upset; Table lookup; Testing; field programmable gate arrays; radiation effects; single event effects;
Conference_Titel :
Radiation Effects Data Workshop, 2006 IEEE
Conference_Location :
Ponte Vedra, FL
Print_ISBN :
1-4244-0638-2
DOI :
10.1109/REDW.2006.295477
