DocumentCode
3334614
Title
A CMOS voltage reference using compensation of mobility and threshold voltage temperature effects
Author
Filanovsky, I.M. ; Bai, Brenda ; Moore, Brian
Author_Institution
Univ. of Alberta, Edmonton, AB, Canada
fYear
2009
fDate
2-5 Aug. 2009
Firstpage
29
Lastpage
32
Abstract
A CMOS voltage reference using compensation of mobility and threshold voltage temperature effects is proposed. In this reference, the nested connection of two NMOS transistors supplies a voltage with positive temperature coefficient, and the diode-connected NMOS transistor supplies a voltage with negative temperature coefficient. These two circuits are connected in series via an operational amplifier, and the resulting voltage that appears in the output stage of this amplifier has low temperature coefficient. The calculations are verified by simulations of the reference designed in 0.13 mum CMOS technology. The simulated reference provides a voltage of about 490 mV with the variation of 1 mV in the temperature range 20 to 120degC. The reference is able to operate with sub-1V power supplies.
Keywords
CMOS integrated circuits; MOSFET; operational amplifiers; CMOS voltage reference; NMOS transistor; negative temperature coefficient; nested connection; operational amplifier; positive temperature coefficient; size 0.13 mum; temperature 20 degC to 120 degC; threshold voltage temperature effect; voltage 1 mV; voltage 490 mV; CMOS technology; Circuit simulation; Diodes; Equations; MOSFETs; Operational amplifiers; Photonic band gap; Power supplies; Temperature distribution; Threshold voltage; CMOS technology; Voltage sources; mobility; temperature compensation; threshold voltage; voltage references;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2009. MWSCAS '09. 52nd IEEE International Midwest Symposium on
Conference_Location
Cancun
ISSN
1548-3746
Print_ISBN
978-1-4244-4479-3
Electronic_ISBN
1548-3746
Type
conf
DOI
10.1109/MWSCAS.2009.5236161
Filename
5236161
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