• DocumentCode
    3334627
  • Title

    Progress and validation of Geant4 based radioactive decay simulation using the examples of Simbol-X and IXO

  • Author

    Hauf, S. ; Kuster, M. ; Pia, M.G. ; Bell, Z. ; Briel, U. ; Chipaux, R. ; Hoffmann, D.H.H. ; Kendziorra, E. ; Laurent, P. ; Strüder, L. ; Tenzer, C. ; Weidenspointner, G. ; Zoglauer, A.

  • Author_Institution
    Inst. fur Kernphys., Tech. Univ. Darmstadt, Darmstadt, Germany
  • fYear
    2009
  • fDate
    Oct. 24 2009-Nov. 1 2009
  • Firstpage
    2060
  • Lastpage
    2065
  • Abstract
    The anticipated high sensitivity and the science goals of the next generation X-ray space missions, like the International X-ray Observatory or Simbol-X, rely on a low instrumental background, which in turn requires optimized shielding concepts. We present Geant4 based simulation results on the IXO Wide Field Imager cosmic ray proton induced background in comparison with previous results obtained for the Simbol-X LED and HED focal plane detectors. Our results show that an improvement in mean differential background flux compared to actually operating X-ray observatories may be feasible with detectors based on DEPFET technology. In addition we present preliminary results concerning the validation of Geant4 based radioactive decay simulation in space applications as a part of the Nano5 project.
  • Keywords
    X-ray astronomy; X-ray detection; astronomical instruments; cosmic ray apparatus; focal planes; space research; DEPFET technology; Geant4 based radioactive decay simulation; HED focal plane detector; IXO Wide Field Imager; International X-ray Observatory; LED focal plane detector; Nano5 project; Simbol-X; X-ray space missions; cosmic ray proton induced background; mean differential background flux; Detectors; Instruments; Light emitting diodes; Observatories; Protons; Radioactive decay; Space missions; Space technology; X-ray detection; X-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-3961-4
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2009.5402112
  • Filename
    5402112