Title : 
QT measurement for TU fused ECG morphology as exhibited during hypoglycaemia
         
        
            Author : 
Ireland, R.H. ; Robinson, R.T.C.E. ; Heller, S.R. ; Harris, N D
         
        
            Author_Institution : 
Dept. of Med. Phys. & Clinical Eng., R. Hallamshire Hosp., Sheffield, UK
         
        
        
            fDate : 
29 Oct-1 Nov 1998
         
        
        
            Abstract : 
During hypoglycaemia, there is typically a change in the ECG characterised by a flattened and prolonged T wave, often accompanied by a fused U wave. In the presence of such U waves, there is no widely accepted method of measuring the QT interval. This study compares two possible methods: using the intersection of the isoelectric line and (1) the T wave, and (2) a tangent to the T wave. The methods were tested on 306 sets of high resolution ECG data recorded during hyperinsulinaemic hypoglycaemic clamp studies. A value of measurement subjectivity was also recorded for each measurement. Results show that the tangent method is more consistent and reproducible than the non-tangent method. Further, the non-tangent method was shown to be significantly more subjective than using a tangent. The tangent method is less reliant on observer experience, is more easily defined and should be considered when ECG data sets have a large number of U waves
         
        
            Keywords : 
electrocardiography; gradient methods; medical signal processing; signal resolution; waveform analysis; Bland Altman plot; QT interval measurement; TU fused ECG morphology; automatic method development; flattened prolonged T wave; fused U wave; high resolution ECG; hypoglycaemia; isoelectric line intersection; measurement subjectivity; tangent method; Clamps; Clinical diagnosis; Electrocardiography; Heart rate interval; Hospitals; Morphology; Neodymium; Particle measurements; Physics; Strontium;
         
        
        
        
            Conference_Titel : 
Engineering in Medicine and Biology Society, 1998. Proceedings of the 20th Annual International Conference of the IEEE
         
        
            Conference_Location : 
Hong Kong
         
        
        
            Print_ISBN : 
0-7803-5164-9
         
        
        
            DOI : 
10.1109/IEMBS.1998.745884