DocumentCode
3334766
Title
Analog Transients in the National VIP-10 and VIP-50 Process
Author
Savage, M.W. ; Seiler, J.E. ; Dunham, G.W. ; Platteter, D.
Author_Institution
NAVSEA Crane, IN
fYear
2006
fDate
38899
Firstpage
160
Lastpage
164
Abstract
The ASET responses of several designs utilizing vertical structures on SOI were evaluated. The devices chosen were the LMH6654, LMH6654, and the LMP7711 operational amplifiers
Keywords
analogue circuits; operational amplifiers; radiation effects; silicon-on-insulator; ASET responses; SOI; analog transients; heavy ion; national VIP-10 process; national VIP-50 Process; operational amplifiers; single event effects; Circuit testing; Cranes; FETs; Metallization; Operational amplifiers; Oscilloscopes; Pulse amplifiers; Relays; Tungsten; Voltage; ASET; SOI; heavy ion; single event effects;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 2006 IEEE
Conference_Location
Ponte Vedra, FL
Print_ISBN
1-4244-0638-2
Type
conf
DOI
10.1109/REDW.2006.295486
Filename
4077300
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