• DocumentCode
    3334863
  • Title

    Measurement of radiation hardness of PET components

  • Author

    Fiedler, F. ; Braess, H. ; Enghardt, W.

  • Author_Institution
    Inst. of Radiat. Phys., Forschungszentrum Dresden-Rossendorf, Dresden, Germany
  • fYear
    2009
  • fDate
    Oct. 24 2009-Nov. 1 2009
  • Firstpage
    2050
  • Lastpage
    2052
  • Abstract
    1N-BEAM PET has given valuable feedback on treatment quality over the 11 years of operation time between 1997 and 2008 of the heavy ion treatment facility at the Gesellschaft fur Schwerionenforschung (GSI) Darmstadt. Based on this technical expertise a next generation of in-beam PET scanners will be developed. An experiment addressing the question whether the detectors and electronic components used in state-of-the-art PET-systems are suitable regarding radiation hardness for configuring a future in-beam PET scanner was performed at the medical beam line of GSI. The detectors used in conventional current PET scanners can be utilized to configure a new in-beam PET scanner for ion therapy units. They have been exposed to a secondary particle fluence equivalent up to 13 years of usage in an in-beam PET scanner. No damage was found analyzing the detectors and the electronics after the experiment.
  • Keywords
    nuclear electronics; particle detectors; positron emission tomography; radiation effects; readout electronics; Gesellschaft fur Schwerionenforschung Darmstadt; detectors components; electronic components; heavy ion treatment facility; in-beam PET scanners; ion therapy unit; medical beam line; radiation hardness; secondary particle fluence; treatment quality; Detectors; Helium; Imaging phantoms; Medical services; Medical treatment; Nuclear and plasma sciences; Positron emission tomography; Power supplies; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-3961-4
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2009.5402127
  • Filename
    5402127