Title :
Correlating Geometry and Shielding Effects on Accelerated Soft Errors in 90nm SRAM Using Spallation Neutron Beams
Author :
Zhu, Xiaowei ; Baumann, Rob ; Takala, Bruce ; Dohmann, Dwayne ; Martinez, Larry
Author_Institution :
Texas Instrum., Dallas, TX
Abstract :
Accelerated soft error data in embedded SRAM in an advanced CMOS DSP are used to determine the impact of geometry and shielding effects on the accuracy of extrapolated product failure rates due to terrestrial neutrons
Keywords :
CMOS digital integrated circuits; SRAM chips; digital signal processing chips; neutron effects; radiation hardening (electronics); shielding; 90 nm; accelerated soft errors; advanced CMOS DSP; correlating geometry; embedded SRAM; product failure rates; shielding effects; spallation neutron beams; terrestrial neutrons; Acceleration; Building materials; CMOS technology; Digital signal processing chips; Geometry; Instruments; Monitoring; Neutrons; Particle beams; Random access memory; Beam; Neutron; Radiation; Shielding;
Conference_Titel :
Radiation Effects Data Workshop, 2006 IEEE
Conference_Location :
Ponte Vedra, FL
Print_ISBN :
1-4244-0638-2
DOI :
10.1109/REDW.2006.295492
