Adaptive sampling for output device characterization

We develop a method of adaptive sampling for use with image output devices, e.g., displays and projectors, that can produce improved results over sampling the input space with a fixed rectangular grid in a multidimensional space. Fixed sampling requires knowledge of the function shape to be effective. Even then the sampling can be grossly inefficient in some regions and grossly undersampled in others. Our method produces a more efficient sampling over the whole gamut of the device output of oddly shaped gamuts, while producing good results for more usual functions. This increased efficiency is important, since measuring samples is the most time-consuming part of the characterization process.